SN74LVTH18502APMG4

Manufacturer: Texas Instruments

Description

IC SCAN-TEST-DEV/XCVR 64-LQFP

Technical Parameters

Parameter Value
Product Status Obsolete
Logic Type ABT Scan Test Device With Universal Bus Transceivers
Number of Circuits -
Current - Output High, Low -
Voltage - Supply -
Operating Temperature -40°C ~ 85°C
Mounting Type Surface Mount
Package / Case 64-LQFP
Supplier Device Package 64-LQFP (10x10)

Industry News